your search
 Results for DC.creator="W." AND DC.creator="Parrish"   page 2 of 3 pages.
Whole-pattern methods
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 5.2.6, pp. 496-496 [ doi:10.1107/97809553602060000596 ]
Google Scholar Parrish, W. & Huang, T. C. (1980). Accuracy of the profile fitting method for X-ray polycrystalline diffractometry. Natl Bur. Stand. (US) Spec. Publ. No. 457, pp. 95–110. Google Scholar Pawley, G. S. (1981). Unit ...

Errors of the Bragg angle
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 5.2.1.3, pp. 491-491 [ doi:10.1107/97809553602060000596 ]

     [more results from section 5.2.1 in volume C]

Errors and uncertainties in wavelength
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 5.2.2.1, pp. 492-492 [ doi:10.1107/97809553602060000596 ]

     [more results from section 5.2.2 in volume C]

Factors determining accuracy
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 5.2.13, pp. 501-504 [ doi:10.1107/97809553602060000596 ]
British Crystallographic Association. Google Scholar Parrish, W., Hart, M., Huang, T. C. & Bellotto, M. (1987). Lattice-parameter determination using synchrotron powder data. Adv. X-ray Anal. 30, 373–382. Google Scholar ...

Angle-dispersive diffractometer methods: conventional sources
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 5.2.4, pp. 495-495 [ doi:10.1107/97809553602060000596 ]
; p = effective particle size. References Mack, M. & Parrish, W. (1967). Seemann–Bohlin X-ray diffractometry. II. Comparison of aberrations and intensity with conventional diffractometer. Acta Cryst. 23 ...

Extrapolation, graphical and analytical
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 5.2.3.2, pp. 493-494 [ doi:10.1107/97809553602060000596 ]

     [more results from section 5.2.3 in volume C]

Energy-dispersive techniques
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 5.2.7, pp. 496-497 [ doi:10.1107/97809553602060000596 ]
11, 165–172. Google Scholar Laguitton, D. & Parrish, W. (1977). Experimental spectral distribution versus Kramers' law for quantitative X-ray fluorescence by the fundamental parameters method. X-ray Spectrom . 6, 201–203. Google ...

Angle-dispersive diffractometer methods: synchrotron sources
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 5.2.5, pp. 495-496 [ doi:10.1107/97809553602060000596 ]
°. References Hart, M. (1981). Bragg angle measurement and mapping. J. Cryst. Growth, 55, 409–427. Google Scholar Hart, M., Cernik, R., Parrish, W. & Toraya, H. (1990). Lattice parameter determination for powders using synchrotron ...

Intensity standards
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 5.2.11, pp. 500-500 [ doi:10.1107/97809553602060000596 ]


Camera methods
Parrish, W., Wilson, A. J. C. and Langford, J. I., International Tables for Crystallography (2006). Vol. C, Section 5.2.8, pp. 497-498 [ doi:10.1107/97809553602060000596 ]


Page: Previous 1 2 3 Next powered by swish-e
























































to end of page
to top of page